Teradyne Inc. recently introduced the newest member of its next-generation Optima 7000-Series of automated optical inspection systems. Launched at the annual IPC – Association Connecting Electronics ...

CHICAGO, IL—According to the new market research report “Automated Optical Inspection System Market by Type (2D AOI Systems, 3D AOI Systems), Technology (Inline AOI, Offline AOI), Industry (Consumer ...

TOKYO--(BUSINESS WIRE)--Saki Corporation, an innovator in the field of automated optical and X-ray inspection and measurement equipment, will demonstrate new automated inspection products, software, ...

TOKYO--(BUSINESS WIRE)--Saki Corporation, an innovator in the field of automated optical and X-ray inspection and measurement equipment, announces the introduction of its 3D-CT automated X-ray ...

Rochester Institute of Technology recently installed a MIRTEC MV3 OMNI automated, optical inspection machine in its Center for Electronics Manufacturing and Assembly (CEMA). The equipment enables ...

To ensure that the speed of composites fabrication keeps pace with customer demand, the ability to inspect and monitor composite part quality must become an integral part of high-rate part ...

The Five-hundred-meter Aperture Spherical radio Telescope (FAST), also known as the “China Sky Eye”, is the world's largest single-dish radio telescope. Its reflector is a partial sphere of radius ...

In traditional semiconductor packaging, manual defect review after automated optical inspection (AOI) is an arduous task for operators and engineers, involving review of both good and bad die. It is ...

When automated optical inspection (AOI) works, it is almost always preferable to human visual inspection. It can be faster, more accurate, more consistent, less expensive, and it never gets tired.

In this interview, Tim Skunes from CyberOptics Corporation talks to AZoM about their 3D optical inspection technology, and how it can be used to solve challenges in SMT electronics manufacturing.

3D surface profilers have been used across many industries since the mid-1970s due to their ability to deliver critical topographic data. The size and type of samples measured using these techniques ...