Test compression technology was invented to address the problem of escalating test-pattern size. Compression allows more test vectors to be applied to an IC in a shorter time and with fewer tester ...

The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...

During the late 1960s and most of the 1970s, the composites industry was absorbing the impact of what was then the recent introduction of carbon fiber. The resulting composites exhibited both high ...

In my previous column, I discussed the influence of column buckling of the composite material test specimen on its measured compressive strength (see "Buckling of composite material compression ...