Reducing the time spent on silicon bring-up is critical in getting ICs into the hands of customers and staying competitive. Typically, the silicon bring-up process involves converting the test ...
Design problems that appear in the late phases of the development cycle can be extremely difficult to track down and debug, thus putting project schedules at risk. It’s not uncommon for an engineer to ...
Scan is a structured test approach in which the overall function of an integrated circuit (IC) is broken into smaller structures and tested individually. Every state element (D flip-flop or latch) is ...
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