As semiconductor devices advance in complexity and sensitivity to power fluctuations, the integration of power-aware automatic test pattern generation (ATPG) is becoming indispensable for yield and ...
Handling timing exception paths in ATPG tools while creating at-speed patterns has always been a tough and tricky task. It is well understood that at-speed testing is a requirement for modern ...
The transition to the 2nm technology node introduces unprecedented challenges in Automated Test Equipment (ATE) bring-up and manufacturability. As semiconductor devices scale down, the complexity of ...
Design for testability (DFT) works to make a circuit more testable to ensure that it was manufactured correctly. Alfred Crouch explains the purpose of DFT in his book, Design-For-Test for Digital ICs ...
Value stream management involves people in the organization to examine workflows and other processes to ensure they are deriving the maximum value from their efforts while eliminating waste — of ...
Santa Clara, Calif.—Agilent Technologies Inc. has expanded its Universal Serial Bus (USB) test portfolio with what it is calling the industry's first automated calibration of a USB 3.0 pattern ...
He's not alone. AI coding assistants have compressed development timelines from months to days. But while development velocity has exploded, security testing is often stuck in an older paradigm. This ...
Recore 3D printer board developer [Elias Bakken] has posted about the automatic test procedure he developed using a stack-up of four (at least) pieces of vintage HP test equipment. In addition, his ...
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