Overview: We have developed an accurate fault modeling tool to capture variation-induced faults in Networks-on-Chip (NoCs). The core of our fault model has circuit-level accuracy, while its ...
A technical paper titled “Best Practices for Advanced Modeling of Safety Mechanisms in an FTA” was published by researchers at University of Stuttgart, Robert Bosch GmbH, Audi AG, and Porsche AG. “To ...
Early results of using device-aware testing on alternative memories show expanded test coverage, but this is just the start. Once the semiconductor industry realized that it was suffering from device ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback