Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...
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AI detects defects in smart factory manufacturing processes even when conditions change
Recently, defect detection systems using artificial intelligence (AI) sensor data have been installed in smart factory manufacturing sites. However, when the manufacturing process changes due to ...
Applied Materials has launched the SEMVision™ H20, a new defect review system designed to enhance the analysis of nanoscale defects in advanced semiconductor chips. This system utilizes cutting-edge ...
The shift to multi-die assemblies is forcing changes in how chips are tested and inspected in order to achieve sufficient yield ramp or respond more quickly to yield excursions.
Production delays and quality errors are a universal challenge in manufacturing. In Aerospace and defense (A&D), however, the stakes are especially high. An equipment failure or out-of-tolerance ...
Recently, defect detection systems using artificial intelligence (AI) sensor data have been installed in smart factory manufacturing sites. However, when the manufacturing process changes due to ...
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