In my previous column, I briefly cited the Short Beam Shear (SBS) test method as a much more attractive interlaminar shear test method than the double-notch shear test method. The primary attraction ...
Nanoscale lithographic technologies have been intensively studied for the development of the next generation of semiconductor manufacturing practices. While mask-less/direct-write electron beam (EB) ...
Researchers have developed a new method for flexibly creating various needle-shaped laser beams. These long, narrow beams can be used to improve optical coherence tomography (OCT), a noninvasive and ...
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