Delicate features, uneven surfaces, and extreme density make it difficult to manage probe force and ensure reliability.
The MEMS-based Mx-FinePitch (Mx-FP) Probe Card addresses the ultra-fine-pitch testing needs of SOC and logic devices. Built for multi-DUT testing in high-volume production environments, the ...
Launching soon on one of the next cargo missions to the International Space Station is the Multi-Needle Langmuir Probe that will measure the “weather” in the upper atmosphere. The experiment is part ...
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