Maybe you should try boundary scan testing now that your continuity buzzer has died. Most engineers are familiar with the theory of boundary scan testing, but what about having actual hands-on ...

The traditional approach to moving scan test data from chip-level pins to core-level scan channels is under pressure due to the dramatic rise in design size, design complexity, and test adaptation. To ...

Integrated circuit complexity and integration continuously advances, posing challenges to the development process. Market profitability, however, demands that products be designed and produced as fast ...