System-level test (SLT), once used largely as a stopgap measure to catch issues missed by automated test equipment (ATE), has evolved into a necessary test insertion for high-performance processors, ...

When checking and verifying capacitors, inductors, diodes, bipolar transistors, and cables, the gamut of test methods can range from those used to confirm a defective component to identifying the ...

Testing verifies that protection schemes meet their intended purpose, ensuring safety and system integrity. Function testing involves manual or electrical manipulation of components to confirm signal ...

Logic BIST (LBIST) is a well-stablished traditional solution for meeting automotive testing standards. However, using pseudo-random LBIST patterns can be challenging when trying to achieve ...

The 2026 Volume 101 marks a new Era following the Century Edition of the AATCC Manual of International Test Methods and Procedures and will be available starting January 1, 2026. Containing three new ...