Duke engineers show how a common device architecture used to test 2D transistors overstates their performance prospects in real-world devices.

A stunning new imaging breakthrough lets scientists see — and fix — the atomic flaws hiding inside tomorrow’s computer chips.

Researchers at Cornell University have developed a powerful imaging technique that reveals atomic scale defects inside computer chips for the first time. Using an advanced electron microscopy method, ...

An organic transistor has opened the way to new generations of neuro-inspired computers, capable of responding in a manner similar to the nervous system. The study of the transistor, based on ...

Cornell researchers have used advanced electron microscopy to identify "mouse bite" defects in 3D transistors for the first time ...

A bioelectronic engineer, Klas Tybrandt of Linkoping University in Sweden, has built the first "ion transistor" computer chip, which uses chemical ions and biological molecules as charge carriers ...

(Nanowerk News) A hacker can reproduce a circuit on a chip by discovering what key transistors are doing in a circuit - but not if the transistor "type" is undetectable. Purdue University engineers ...