Electron beams (cyan haze in top left) are routinely used to determine the molecular structures of biomolecules in ...

ZEISS Crossbeam 750 ZEISS Crossbeam 750 FIB-SEM advances live, high-resolution “see while you mill” capability, providing ...

A new analysis reveals what happens when very short or narrow electron beams encounter a particle. The research is published ...

A team led by scientists at the National Graphene Institute (NGI) at The University of Manchester has developed the first ...

The aerospace and defense sector is undergoing rapid material transformation. Additive manufacturing, high-temperature superalloys, advanced aluminum systems, multilayer coatings, and emerging ...

Cornell University researchers have built an AI system called EMSeek that can analyze an electron microscopy image and ...

Through a combination of smarter material choices and machine learning techniques, a team led by Sarah Haigh at the University of Manchester showed how these graphene “nano-aquariums” can work with ...

Tescan will showcase its integrated semiconductor failure analysis solutions at SEMICON China 2026, covering key stages from ...

Edward Cole and Charles Hanley have spent decades solving hard problems in microelectronics and energy systems at Sandia ...

A new publication from Opto-Electronic Technology; DOI 10.29026/oet.2026.250009, discusses progress and applications of ...

Zeiss has unveiled the new Zeiss Crossbeam 750 focused ion beam-scanning electron microscope (FIB-SEM), optimised for ...

An electron microscopy image can capture atoms arranged in a crystal lattice or defects threading through a semiconductor ...