Abstract: The Wafer Acceptance Test (WAT) is a significant quality control measurement in the semiconductor industry. However, because the WAT process can be time-consuming and expensive, sampling ...

Programming efficient asynchronous systems is challenging because it can often be hard to express the design declaratively, or to defend against interleaving-dependent bugs such as data races and ...

Abstract: Bending cables can cause irreversible damage to the tracks and rails of fast drag chain machines. To swiftly and precisely identify bent cables within these machines, an intelligent ...